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Joint Test Action Group
Results: 911

#	Item
841	Forensic Data Recovery from Flash Memory Add to Reading List Source URL: www.ssddfj.org Language: English - Date: 2013-04-19 15:56:31 Flash memory Flash file system USB flash drive Joint Test Action Group Open NAND Flash Interface Working Group Solid-state drive Wear leveling Non-volatile memory Read-only memory Computer memory Computer hardware Computing
842	Verification, Characterization, and Debugging of the HP PA 7200 Processor To guarantee a high-quality product the HP PA 7200 CPU chip was Add to Reading List Source URL: www.hpl.hp.com Language: English - Date: 1996-08-05 19:03:12 Electronics manufacturing Electronic design automation Embedded systems Graphical user interface testing Joint Test Action Group Post-silicon validation Test strategy Logic simulation Debugger Electronic engineering Electronics Software testing
843	Features • Pre-programmed bootloader for AVR UC3 A0, A1, A3, B0, B1 series • USB DFU Bootloaders up to version 1.0.3 Add to Reading List Source URL: www.atmel.com Language: English Microcontrollers Instruction set architectures Embedded systems AVR32 Booting Joint Test Action Group Universal Serial Bus Atmel Atmel AVR Computer architecture Computer hardware Electronics
844	AVR JTAGICE mkll On-chip Debug System Add to Reading List Source URL: www.atmel.com Language: English Computer architecture Computing Instruction set architectures Atmel AVR Norwegian Institute of Technology Debugging Joint Test Action Group DebugWIRE Atmel Microcontrollers Electronics Embedded systems
845	Features • High Performance, Low Power 32-Bit Atmel® AVR® Microcontroller Add to Reading List Source URL: www.atmel.com Language: English Electronics Instruction set architectures Embedded systems Digital electronics Atmel AVR Norwegian Institute of Technology AVR32 Joint Test Action Group Serial Peripheral Interface Bus Computer hardware Computer architecture Microcontrollers
846	® February 2002, ver. 4.3 Add to Reading List Source URL: www.altera.com Language: English - Date: 2003-01-08 23:21:50 Electronics manufacturing IEEE standards Embedded systems Joint Test Action Group RS-232 Programmer Serial port Serial cable Atmel AVR Electronics Electronic engineering Technology
847	Actel Corporation 2010 Add to Reading List Source URL: www.actel.com Language: English - Date: 2010-04-22 19:12:36 Actel Field-programmable gate array Xilinx Joint Test Action Group Altera Microcontroller Intel MCS-51 Application-specific integrated circuit Synplicity Electronic engineering Electronics Fabless semiconductor companies
848	Design Principles for Tamper-Resistant Smartcard Processors Oliver K¨ommerling Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 1999-05-31 07:23:55 Electronic engineering Microcode Microarchitecture Clock signal Digital signal processor Microcontroller Cell Pirate decryption Joint Test Action Group Computer architecture Central processing unit Computer hardware
849	Data Sheet: MAX 7000 Programmable Logic Device Family Add to Reading List Source URL: www.biakom.com Language: English - Date: 2006-05-05 04:26:32 Programmable logic device Computer buses IBM PC compatibles Joint Test Action Group Logic gate Erasable programmable logic device Altera Hardware Description Language Conventional PCI Programmable Array Logic Electronic engineering Electronics Electronics manufacturing
850	R2010C FAST ETHERNET RISC PROCESSOR Add to Reading List Source URL: www.paradigmtools.com Language: English - Date: 2008-09-09 19:07:24 Instruction set architectures Microcontrollers Embedded systems Management Data Input/Output Universal asynchronous receiver/transmitter Joint Test Action Group Synchronous dynamic random-access memory Interrupt DEC Alpha Computer architecture Electronics Electronic engineering

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